Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5372645 | Method for determining thickness of chemical vapor deposited layers | James F. Fleischer, David Woodruff | 1994-12-13 |
TF
Thomas R. Fnthony
Overall (All Time): #3,813,238 of 4,157,543Top 95%
1
Patents All Time