Thomas E. Bantel — 8 Patents at GE

Thomas E. Bantel has been granted 8 US patents while listed as an inventor at GE. The first was granted in 1987 and the most recent in March 2013. Thomas E. Bantel ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Thomas E. Bantel in Cincinnati, OH, US.

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8393784	Characterization of flaws in composites identified by thermography	Harry Israel Ringermacher, Donald Robert Howard, Bryon Edward Knight, William George Patterson	2013-03-12	$36,963,000
7266174	Radiographic inspection of airframes and other large objects	Thomas William Birdwell	2007-09-04	$64,686,000
5703362	Method for nondestructive/noncontact detection and quantification of alpha case on a surface of a workpiece made of titanium or a titanium-based alloy	John Devitt, Thomas R. Edwards	1997-12-30	$90,637,000
5111048	Apparatus and method for detecting fatigue cracks using infrared thermography	John Devitt, Joseph M. Sparks, Janet S. Kania	1992-05-05	$10,275,000
5111046	Apparatus and method for inspecting cooling holes	—	1992-05-05	$10,275,000
4818118	Coating thickness measurement	David F. Lahrman, John F. Halase, III	1989-04-04	$7,791,000
4644162	Cooling hole inspection	David Charles Mack	1987-02-17	$10,011,000
4634291	Coating thickness measurement	David F. Lahrman, John F. Halase, III	1987-01-06	$5,858,000

Thomas E. Bantel — 8 Patents

Issued Patents All Time

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