KT

Kwok C. Tam

GE: 30 patents #700 of 36,430Top 2%
SR Siemens Corporate Research: 21 patents #7 of 277Top 3%
SA Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
SR Siemens Corporation Research: 1 patents #4 of 25Top 20%
📍 Schenectady, NY: #33 of 1,353 inventorsTop 3%
🗺 New York: #1,608 of 115,490 inventorsTop 2%
Overall (All Time): #46,342 of 4,157,543Top 2%
55
Patents All Time

Issued Patents All Time

Showing 51–55 of 55 patents

Patent #TitleCo-InventorsDate
5032990 Translate rotate scanning method for x-ray imaging Jeffrey Wayne Eberhard 1991-07-16
4922421 Flaw characterization by multiple angle inspection 1990-05-01
4888693 Method to obtain object boundary information in limited-angle computerized tomography 1989-12-19
4866614 Ultrasound characterization of 3-dimensional flaws 1989-09-12
4506327 Limited-angle imaging using multiple energy scanning 1985-03-19