Patents per Year
Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7065176 | Method and system to inspect a component | Kevin Moermond, Andy Joseph Galish, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe +1 more | 2006-06-20 | $33,096,000 |
| 6895079 | Multiple focal spot X-ray inspection system | Thomas William Birdwell, Andrew Joseph Galish | 2005-05-17 | $26,990,000 |
| 4803639 | X-ray inspection system | Douglas S. Steele, Larry C. Howington, James W. Schuler, Joseph J. Sostarich, Charles R. Wojciechowski +13 more | 1989-02-07 | $13,060,000 |