Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8314611 | Magnetic particle inspection apparatus and method | Manu Mathai, Grady Baggett | 2012-11-20 |
| 7805998 | Apparatus and method for inspection of turbine valve seats | — | 2010-10-05 |
| 7535565 | System and method for detecting and analyzing compositions | Warren Arthur Nelson | 2009-05-19 |
| 7440097 | Laser plasma spectroscopy apparatus and method for in situ depth profiling | Pamela Benicewicz, Pavel A. Fomitchov, Elena Rozier, Tymm Bradner Schumaker | 2008-10-21 |
| 7303373 | Wind turbine systems, monitoring systems and processes for monitoring stress in a wind turbine blade | — | 2007-12-04 |
| 7064825 | Methods and apparatus for evaluating rotary machinery | Tymm Bradner Schumaker | 2006-06-20 |
| 6952094 | Nondestructive inspection method and system therefor | — | 2005-10-04 |
| 6698288 | Method and system for assembling and nondestructive testing of assemblies with composite components | Shahram Shirzad | 2004-03-02 |
| 6288537 | Eddy current probe with foil sensor mounted on flexible probe tip and method of use | Martin Lee | 2001-09-11 |
| 5963882 | Ultrasonic pulser/receiver for ultrasonic test equipment | Elizabeth Dixon, Mederic E. Auger | 1999-10-05 |
| 5544953 | Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects | — | 1996-08-13 |
| 5430376 | Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects | — | 1995-07-04 |
| 5334934 | Eddy current probe apparatus and interlaced scanning method for interior inspection of metal devices | — | 1994-08-02 |
| 5329230 | Carriage for eddy current probe having contact ball engagement between carriage and translation means | Fred R. Burkhardt, Jr. | 1994-07-12 |
| 4920319 | Method and apparatus for determining the thickness of a coating on a metal substrate | — | 1990-04-24 |
| 4706020 | High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material | Mederic E. Auger | 1987-11-10 |
| 4593245 | Eddy current method for detecting a flaw in semi-conductive material | Mederic E. Auger | 1986-06-03 |
| 4249423 | Semi-nondestructive residual stress measurement | Marshall Gordon Jones | 1981-02-10 |