Issued Patents All Time
Showing 76–100 of 110 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6999646 | All optical data selection element | — | 2006-02-14 |
| 6990281 | All optical logic gates | Eldan Halberthal | 2006-01-24 |
| 6956998 | Compact optical delay lines | Eldan Halberthal | 2005-10-18 |
| 6946660 | Two-dimensional radiation detector | Uri El-Hanany | 2005-09-20 |
| 6892016 | Optical threshold devices and methods | Eldan Halberthal | 2005-05-10 |
| 6795626 | Optical threshold devices and methods | Eldan Halberthal | 2004-09-21 |
| 6765213 | Gamma-ray detector for coincidence detection | Uri El-Hanany, Alex Tsigelman, Shimon Klier, Eldan Halberthal | 2004-07-20 |
| 6628446 | High-resolution reading and writing using beams and lenses rotating at equal or double speed | Nira Schwartz | 2003-09-30 |
| 6603904 | All optical narrow pulse generator and switch for dense time division multiplexing and code division multiplexing | — | 2003-08-05 |
| 6603589 | Circular scanning patterns | Jacob Karin, Gilad Golan | 2003-08-05 |
| 6522443 | High-resolution writing using beams and lenses rotating at equal or double speed | Nira Schwartz | 2003-02-18 |
| 6466352 | High-resolution reading and writing scan system for planar and cylindrical surfaces | Nira Schwartz | 2002-10-15 |
| 6310710 | High-resolution reading and writing using beams and lenses rotating at equal or double speed | Nira Schwartz | 2001-10-30 |
| 6285029 | Semiconductor gamma-ray detector | Uri El-Hanany, Alex Tsigelman, Shimon Klier, Eldan Halberthal | 2001-09-04 |
| 6252980 | Additional dynamic fluid level and bubble inspection for quality and process control | Nira Schwartz, Richard W. Woods | 2001-06-26 |
| 6124934 | High-accuracy high-stability method and apparatus for measuring distance from surface to reference plane | Richard W. Woods, Nira Schwartz | 2000-09-26 |
| 6034373 | Semiconductor radiation detector with reduced surface effects | Uri El-Hanany, Alex Tsigelman, Alex Gorin, Shimon Klier, Eldan Halbertal | 2000-03-07 |
| 5905264 | Semiconductor detector | Uri El-Hanany, Alex Tsigelman, Alex Gorin, Shimon Klier, Eldan Halbertal | 1999-05-18 |
| 5847398 | Gamma-ray imaging with sub-pixel resolution | Uri El-Hanany, Alex Tsigelman, Shimon Klier, Alexander Gorin, Eldan Halberthal | 1998-12-08 |
| 5828483 | Printing and inspection system using rotating polygon and optical fibers | Nira Schwartz | 1998-10-27 |
| 5591971 | Shielding device for improving measurement accuracy and speed in scanning electron microscopy | Nira Schwartz, Richard W. Woods | 1997-01-07 |
| RE35350 | Method and apparatus for measuring surface distances from a reference plane | Nira Schwartz | 1996-10-08 |
| 5557438 | Scanning and tracking using rotating polygons | Nira Schwartz | 1996-09-17 |
| 5481619 | Inspection method using templates images, unique histogram analysis, and multiple gray levels correlated to addresses of template images | Nira Schwartz, Richard W. Woods | 1996-01-02 |
| 5414778 | Dynamic fluid level and bubble inspection for quality and process control | Nira Schwartz, Richard W. Woods | 1995-05-09 |