Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6914244 | Ion beam milling system and method for electron microscopy specimen preparation | — | 2005-07-05 |
| 6768110 | Ion beam milling system and method for electron microscopy specimen preparation | — | 2004-07-27 |
| 6388262 | Double tilt and rotate specimen holder for a transmission electron microscope | Barbara L. Armbruster, Richard Mitro, Leszek Malaszewski, Robert Michael Kozar, Ronald Zolkowski +1 more | 2002-05-14 |
| 5922179 | Apparatus for etching and coating sample specimens for microscopic analysis | Richard Mitro, Leszek Malaszewski | 1999-07-13 |
| 5472566 | Specimen holder and apparatus for two-sided ion milling system | Peter R. Swann | 1995-12-05 |