Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7376536 | Method for investigating cause of decrease in frequency of abnormality detections, method for improving frequency of abnormality detections and electronic control apparatus | Masatoshi Watanabe, Shigeru Matsumoto, Koichi Ohgaki | 2008-05-20 |