IM

Isao Motomura

FL Fujitsu Semiconductor Limited: 1 patents #612 of 1,301Top 50%
📍 Shinjuku, JP: #174 of 337 inventorsTop 55%
Overall (All Time): #3,223,299 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8270703 Defect inspection apparatus, defect inspection method, and manufacture method for semiconductor device Naohiro Takahashi 2012-09-18