Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7640124 | Delay failure test circuit | Hideaki Konishi, Ryuji Shimizu, Haruhiko Abe, Satoshi Masuda, Naofumi Kobayashi | 2009-12-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7640124 | Delay failure test circuit | Hideaki Konishi, Ryuji Shimizu, Haruhiko Abe, Satoshi Masuda, Naofumi Kobayashi | 2009-12-29 |