Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7603248 | Testing circuit and testing method for semiconductor device and semiconductor chip | Hidetoshi Sugiyama, Masao Nakajima, Hideaki Suzuki | 2009-10-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7603248 | Testing circuit and testing method for semiconductor device and semiconductor chip | Hidetoshi Sugiyama, Masao Nakajima, Hideaki Suzuki | 2009-10-13 |