Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6518784 | Test method using semiconductor test apparatus | Norio Fukasawa | 2003-02-11 |
| 6388461 | Semiconductor inspection apparatus and inspection method using the apparatus | Norio Fukasawa | 2002-05-14 |
| 6333638 | Semiconductor test apparatus and test method using the same | Norio Fukasawa | 2001-12-25 |
| 6246249 | Semiconductor inspection apparatus and inspection method using the apparatus | Norio Fukasawa | 2001-06-12 |
| 5767528 | Semiconductor device including pad portion for testing | Norio Fukasawa | 1998-06-16 |