Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8436633 | Method to determine needle mark and program therefor | Satoshi Sano | 2013-05-07 |
| 7977961 | Component for testing device for electronic component and testing method of the electronic component | Daisuke Koizumi, Naohito Kohashi | 2011-07-12 |
| 6781223 | Semiconductor device having a signal lead exposed on the undersurface of a sealing resin with an air gap between the signal lead and a mounting substrate | Takayuki Mihara | 2004-08-24 |
| 6392433 | Method and apparatus for testing semiconductor devices | Kenji Itasaka, Terumi Kamifukumoto, Nobuo Ooyama | 2002-05-21 |