Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4553090 | Method and apparatus for testing a logic circuit using parallel to serial and serial to parallel conversion | Kiyoshi Wada, Ichiro Midorikawa | 1985-11-12 |
YH
Yoshinori Hatano
Overall (All Time): #4,024,672 of 4,157,543Top 100%
1
Patents All Time