Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8644093 | Writing circuit, semiconductor integrated circuit and writing method | — | 2014-02-04 |
| 8166380 | Method and apparatus for identifying paths having appropriate lengths for fault simulation | — | 2012-04-24 |
| 8081528 | Integrated circuit and method for testing the circuit | — | 2011-12-20 |
| 7895492 | Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer product | Tatsuru Matsuo | 2011-02-22 |
| 7761761 | Semiconductor integrated circuit, test data generating device, LSI test device, and computer product | Tatsuru Matsuo | 2010-07-20 |
| 7757138 | Semiconductor integrated circuit, test data generating device, LSI test device, and computer product | Tatsuru Matsuo | 2010-07-13 |
| 7734973 | Testing apparatus and testing method for an integrated circuit, and integrated circuit | Hitoshi Yamanaka | 2010-06-08 |
| 7337379 | Apparatus and method for diagnosing integrated circuit | — | 2008-02-26 |
| 7266746 | Device and method for testing integrated circuit | — | 2007-09-04 |
| 7178078 | Testing apparatus and testing method for an integrated circuit, and integrated circuit | Hitoshi Yamanaka, Junko Kumagai, Hideaki Konishi, Daisuke Maruyama | 2007-02-13 |
| 5815513 | Test pattern preparation system | — | 1998-09-29 |