Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7013414 | Test method and test system for semiconductor device | Masayuki Takeshige, Kenji Yamada | 2006-03-14 |
| 6502179 | Method and apparatus for compactly storing instruction codes | Teruyoshi Kondo, Masayuki Takeshige, Hayato Isobe, Yukisato Miyazaki, Kunihiro Ohara +2 more | 2002-12-31 |