Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7177599 | Line quality characteristic evaluation system | Isao Nakazawa, Yoshiaki Kobayashi, Toshikazu Youkai, Tatsuaki Hamai, Kaoru Murakami +1 more | 2007-02-13 |
| 7107011 | Interference measurement and evaluation system | Isao Nakazawa, Yoshiaki Kobayashi, Toshikazu Youkai, Tatsuaki Hamai, Kaoru Murakami +1 more | 2006-09-12 |
| 4248533 | Distorted texture detecting method | — | 1981-02-03 |