Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7630845 | Method for calculating tolerable value for fluctuation in power supply voltage and method of testing | Tomohiko Koto | 2009-12-08 |
| 7062747 | Method and apparatus for prepareing patterns used for manufacture of semiconductor device | Yukisada Horie, Takeo Moriyama, Takashi Kurihara | 2006-06-13 |