Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7516376 | Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product | Hideaki Konishi | 2009-04-07 |
| 7315997 | Method and apparatus for supporting designing of LSI, and computer product | Hitoshi Watanabe, Hideaki Konishi, Yuko Katoh, Kazuyuki Yamamura, Naoko Karasawa +6 more | 2008-01-01 |