Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9401192 | Ferroelectric memory device and timing circuit to control the boost level of a word line | Keizo Morita, Tomohisa Hirayama | 2016-07-26 |
| 8609246 | Electroconductive fine particles, anisotropic electroconductive material, and electroconductive connection structure | Ren-de Sun, Kiyoto Matsushita, Taku Sasaki, Shinya Uenoyama, Nobuyuki Okinaga | 2013-12-17 |
| 7675773 | Semiconductor memory, test method of semiconductor memory and system | Kaoru Mori, Toshikazu Nakamura, Jun Ohno | 2010-03-09 |
| 7650536 | Forced termination condition monitoring device, forced termination condition monitoring method and storage medium embodying forced termination condition monitoring program | Kouitirou Takahasi | 2010-01-19 |
| 7649796 | Semiconductor memory and operating method of same | Atsushi Fujii | 2010-01-19 |
| 7642844 | Semiconductor integrated circuit for voltage detection | — | 2010-01-05 |
| 7557645 | Semiconductor device | — | 2009-07-07 |
| 7427885 | Semiconductor device having a power supply capacitor | — | 2008-09-23 |
| 7330062 | Input/output logical circuit | Hiroyuki Kobayashi | 2008-02-12 |
| 7190204 | Logical circuit | Hiroyuki Kobayashi | 2007-03-13 |
| 6922750 | Semiconductor memory device capable of simultaneously reading data and refreshing data | — | 2005-07-26 |
| 6754126 | Semiconductor memory | Shusaku Yamaguchi, Toshiya Uchida, Yoshimasa Yagishita, Yoshihide Bando, Masahiro Yada +4 more | 2004-06-22 |
| 6728157 | Semiconductor memory | Yoshimasa Yagishita, Toshiya Uchida, Yoshihide Bando, Hiroyuki Kobayashi, Shusaku Yamaguchi | 2004-04-27 |
| 6667913 | Semiconductor memory device | Hiroyuki Kobayashi | 2003-12-23 |
| 6535452 | Semiconductor memory device having error correction function for data reading during refresh operation | Toshiya Uchida | 2003-03-18 |
| 6337833 | Memory device | Kazuyuki Kanazashi, Toshiya Uchida | 2002-01-08 |
| 6199025 | Semiconductor device having selectable device type and methods of testing device operation | Atsushi Fujii | 2001-03-06 |
| 6104659 | Memory device | Yoshimasa Yagishita, Toshiya Uchida | 2000-08-15 |