Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8059278 | Optical wave interference measuring apparatus | Hideo Kanda, Takayuki Saito, Noboru Koizumi | 2011-11-15 |
| 7982882 | Optical wave interference measuring apparatus | Hideo Kanda, Takayuki Saito, Noboru Koizumi | 2011-07-19 |
| 7880897 | Light wave interferometer apparatus | — | 2011-02-01 |
| 7792366 | Method of measuring amount of eccentricity | Kenichi Takahashi | 2010-09-07 |
| 7719691 | Wavefront measuring apparatus for optical pickup | — | 2010-05-18 |
| 7538890 | Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof | Takayuki Saito, Minoru Kurose | 2009-05-26 |
| 7245384 | Sample inclination measuring method | Fumio Kobayashi, Kunihiko Tanaka | 2007-07-17 |
| 7119907 | Low coherent interference fringe analysis method | — | 2006-10-10 |
| 6950191 | Method of extracting circular region from fringe image | — | 2005-09-27 |
| 6947149 | Method of assisting sample inclination error adjustment | Fumio Kobayashi, Kunihiko Tanaka | 2005-09-20 |
| 6778281 | Phase shift fringe analysis method and apparatus using the same | — | 2004-08-17 |
| 6768554 | Fringe analysis method using fourier transform | — | 2004-07-27 |
| 6707559 | Method of detecting posture of object and apparatus using the same | — | 2004-03-16 |
| 6693715 | Fringe analysis method using fourier transform | — | 2004-02-17 |
| 6621579 | Fringe analysis method and apparatus using Fourier transform | — | 2003-09-16 |
| 6532073 | Fringe analysis error detection method and fringe analysis error correction method | — | 2003-03-11 |