Zongtao Ge — 16 Patents at Fujinon

Zongtao Ge has been granted 16 US patents while listed as an inventor at Fujinon. The first was granted in 2003 and the most recent in November 2011. Zongtao Ge ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Zongtao Ge in Saitama, JP.

Patents per Year

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8059278	Optical wave interference measuring apparatus	Hideo Kanda, Takayuki Saito, Noboru Koizumi	2011-11-15
7982882	Optical wave interference measuring apparatus	Hideo Kanda, Takayuki Saito, Noboru Koizumi	2011-07-19
7880897	Light wave interferometer apparatus	—	2011-02-01
7792366	Method of measuring amount of eccentricity	Kenichi Takahashi	2010-09-07
7719691	Wavefront measuring apparatus for optical pickup	—	2010-05-18
7538890	Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof	Takayuki Saito, Minoru Kurose	2009-05-26
7245384	Sample inclination measuring method	Fumio Kobayashi, Kunihiko Tanaka	2007-07-17
7119907	Low coherent interference fringe analysis method	—	2006-10-10
6950191	Method of extracting circular region from fringe image	—	2005-09-27
6947149	Method of assisting sample inclination error adjustment	Fumio Kobayashi, Kunihiko Tanaka	2005-09-20
6778281	Phase shift fringe analysis method and apparatus using the same	—	2004-08-17	$12,000
6768554	Fringe analysis method using fourier transform	—	2004-07-27	$15,000
6707559	Method of detecting posture of object and apparatus using the same	—	2004-03-16	$14,000
6693715	Fringe analysis method using fourier transform	—	2004-02-17	$21,000
6621579	Fringe analysis method and apparatus using Fourier transform	—	2003-09-16	$19,000
6532073	Fringe analysis error detection method and fringe analysis error correction method	—	2003-03-11	$28,000