NY

Naoko Yoshida

FU Fujifilm: 10 patents #889 of 4,519Top 20%
Eastman Kodak: 3 patents #2,892 of 8,114Top 40%
ND Nitto Denko: 3 patents #959 of 2,479Top 40%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
Overall (All Time): #262,836 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
12283033 Damage diagram creation support method and damage diagram creation support device Tadashi Kasamatsu, Makoto Yonaha 2025-04-22
12235191 Flight imaging system and method Tadashi Kasamatsu, Yasukazu Nihei, Hiroaki Nakamura, Makoto Yonaha 2025-02-25
10964062 Skin evaluation device, skin evaluation method, and skin evaluation program 2021-03-30
10743769 Skin evaluation apparatus, skin evaluation method, and skin evaluation program Yoshitaka Yamaguchi, Hideyasu Ishibashi, Eriko IKEDA, Takeharu Tani 2020-08-18
10638968 Skin gloss evaluation device, skin gloss evaluation method, and skin gloss evaluation program 2020-05-05
10383567 Skin evaluation method and skin evaluation device Karin Kuroiwa 2019-08-20
10188352 Acne-affected skin determination method and acne-affected skin determination device Noriko Ohira 2019-01-29
9787965 Camera system, color conversion device and method employed thereupon, and recording medium for color conversion program Koichi Tozuka, Hideyasu Ishibashi, Ryusuke Osanai 2017-10-10
9750326 Transparency evaluation device, transparency evaluation method and transparency evaluation program Ikuko Ohgaru 2017-09-05
9450158 Epoxy resin composition for optical semiconductor device, and lead frame for optical semiconductor device, encapsulation type optical semiconductor element unit and optical semiconductor device each obtainable by using the epoxy resin composition Kazuhiro FUKE, Hidenori Onishi, Ryusuke Naito, Yuichi Fukamichi 2016-09-20
9351683 Wrinkle detection method, wrinkle detection device and recording medium storing wrinkle detection program, as well as wrinkle evaluation method, wrinkle evaluation device and recording medium storing wrinkle evaluation program 2016-05-31
8183093 Method of manufacturing a semiconductor device by lamination Takashi Oda, Shigenori Morita 2012-05-22
8124457 Manufacturing method of transferring a wiring circuit layer on a metal support substrate to a semiconductor element Takashi Oda, Shigenori Morita 2012-02-28
5776358 Electrolyte for driving electrolytic capacitor and electrolytic capacitor using the same Nario Niibo, Yoshinori Takamuku 1998-07-07
5121444 Pattern recognition apparatus Yoshinori Takizawa 1992-06-09
5065440 Pattern recognition apparatus Yoshinori Takizawa 1991-11-12
4933686 Method of and apparatus for transferring an image in a thermal transfer printer Masaki Izumi, Yoshio Wachi 1990-06-12