Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11586778 | Secured memory | Robert Giterman, Itamar Levi, Osnat Keren, Alexander Fish, Maoz Vizentovski | 2023-02-21 |
| 11321460 | Information redistribution to reduce side channel leakage | Alexander Fish, Osnat Keren, Matan Elkoni | 2022-05-03 |
| 10999083 | Detecting unreliable bits in transistor circuitry | Joseph Shor, Yitzhak Schifmann | 2021-05-04 |
| 10811073 | Dynamic memory physical unclonable function | Robert Giterman, Adam Teman | 2020-10-20 |
| 10630493 | Physical unclonable functions related to inverter trip points | Joseph Shor, Roi Levi | 2020-04-21 |
| 9671456 | Semiconductor device arrangement, a method of analysing a performance of a functional circuit on a semiconductor device and a device analysis system | Jacob Fridburg, Shai Shperber | 2017-06-06 |
| 9606064 | Method of detecting irregular current flow in an integrated circuit device and apparatus therefor | Anton Rozen, Leonid Fleshel, Michael Priel | 2017-03-28 |
| 8430562 | Device and method for evaluating a temperature | Lior Aviv, Shai Shperber | 2013-04-30 |
| 8368383 | Method for testing a variable digital delay line and a device having variable digital delay line testing capabilities | Yefim-Haim Fefer, Mikhail Bourgart, Segey Sofer | 2013-02-05 |
| 8134384 | Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilities | Yehim-Haim Fefer, Sergey Sofer | 2012-03-13 |
| 8070357 | Device and method for evaluating a temperature | Lior Aviv, Shai Shperber | 2011-12-06 |
| 7151387 | Analysis module, integrated circuit, system and method for testing an integrated circuit | Shai Shperber, Ezra Baruch | 2006-12-19 |