Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372771 | Method of grouping embedded memories for testing | Dhiraj Maheshwari | 2016-06-21 |
| 9366724 | Scan testing with staggered clocks | Darrell L. Carder, Robert N. Ehrlich | 2016-06-14 |
| 7966529 | System and method for testing memory blocks in an SOC design | Bipin Duggal, Gulshan Kumar Miglani | 2011-06-21 |