Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7633307 | Method for determining temperature profile in semiconductor manufacturing test | Vincent Vu | 2009-12-15 |
| 6433568 | Massive parallel semiconductor manufacturing test process | Judy A. Lanoux, Jayme W. Richard, Vincent Vu | 2002-08-13 |