Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7322000 | Methods and apparatus for extending semiconductor chip testing with boundary scan registers | Tomas Colunga, Joseph S. Vaccaro | 2008-01-22 |
| 7272767 | Methods and apparatus for incorporating IDDQ testing into logic BIST | Tomas Colunga, Sribhaskar Mahadevan, Joseph S. Vaccaro | 2007-09-18 |