JB

Jon C. Baker

FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
🗺 Texas: #73,555 of 125,132 inventorsTop 60%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7676769 Adaptive threshold wafer testing device and method thereof Lai Chung Chan 2010-03-09