Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055587 | Integrated test circuit, test assembly and method for testing an integrated circuit | Tobias Kilian, Martin Huch, Daniel Tille | 2024-08-06 |
| 11874325 | Integrated circuit, test assembly and method for testing an integrated circuit | Tobias Kilian, Martin Huch, Daniel Tille | 2024-01-16 |
| 11619668 | Integrated circuit with self-test circuit, method for operating an integrated circuit with self-test circuit, multi-core processor device and method for operating a multi-core processor device | Daniel Tille, Jens Rosenbusch | 2023-04-04 |
| 9529047 | Integrated circuit device and method of performing self-testing within an integrated circuit device | Markus Regner, Vladimir Vorisek | 2016-12-27 |
| 9448283 | Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangement | Claudia Latzel, Bernhard Richter | 2016-09-20 |
| 9435862 | Integrated circuit device and method therefor | Vladimir Litovchenko, Andreas Stahl | 2016-09-06 |
| 9091726 | Method and apparatus for performing self-testing within an IC device | Markus Regner, Vladimir Vorisek | 2015-07-28 |