GW

Guoping Wan

FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Overall (All Time): #3,035,195 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8935584 System and method for performing scan test Shayan Zhang, Wanggen Zhang 2015-01-13