Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7689897 | Method and device for high speed testing of an integrated circuit | Michael Priel, Amir Zatlzman | 2010-03-30 |
| 6076096 | Binary rate multiplier | Yoram Salant, Oded Norman, Vladimir Koifman | 2000-06-13 |