Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7579590 | Method of measuring thin layers using SIMS | Zhi-Xiong Jiang | 2009-08-25 |
| 7527976 | Processes for testing a region for an analyte and a process for forming an electronic device | Steven M. Hues, Hassan F. Fakhreddine, Michael L. Lovejoy | 2009-05-05 |