Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733302 | Circuit for monitoring metal degradation on integrated circuit | Zhichen Zhang, John M. Pigott, Qilin Zhang, Michael J. Zunino | 2017-08-15 |
| 9222968 | Monitoring system for detecting degradation of integrated circuit | Zhichen Zhang, Qilin Zhang | 2015-12-29 |
| 8479130 | Method of designing integrated circuit that accounts for device aging | Zhichen Zhang | 2013-07-02 |