Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7342402 | Method of probing a device using captured image of probe structure in which probe tips comprise alignment features | Tae Ma Kim | 2008-03-11 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7342402 | Method of probing a device using captured image of probe structure in which probe tips comprise alignment features | Tae Ma Kim | 2008-03-11 |