| D1064874 |
Electrical test device |
— |
2025-03-04 |
| 12061213 |
Non-contact voltage measurement with adjustable size rogowski coil |
Gloria M. Chun, Ricardo Rodriguez, Ronald Steuer |
2024-08-13 |
| D1029665 |
Power quality analyzer |
Scott M. Tsukamaki, David Gibson, Roger L. Howell |
2024-06-04 |
| D1006660 |
Power quality analyzer |
Scott M. Tsukamaki, David Gibson, Roger L. Howell |
2023-12-05 |
| 11821925 |
Accessory for utilization with non-contact electrical detector |
Brian D. Painting, Luis R. Silva, Ronald Steuer |
2023-11-21 |
| D993054 |
Clamp meter |
Christopher D. Corrigan, Brian S. Aikins, Jeffrey Worones |
2023-07-25 |
| 11693033 |
Sensor probe with combined non-contact sensor and a Rogowski coil |
Ronald Steuer, Gloria M. Chun, Simon J. Page |
2023-07-04 |
| 11662368 |
Non-contact voltage measurement with adjustable size Rogowski coil |
Gloria M. Chun, Ricardo Rodriguez, Ronald Steuer |
2023-05-30 |
| 11513140 |
Sensor probe with clamp having adjustable interior region for non-contact electrical measurement |
Gloria M. Chun, Ricardo Rodriguez |
2022-11-29 |
| D953177 |
Documenting process calibrator |
Matthew Carl-Robert Bannister |
2022-05-31 |
| D938843 |
Clamp meter |
Christopher D. Corrigan, Brian S. Aikins, Jeffrey Worones |
2021-12-21 |
| D934707 |
Self-leveling laser level |
Paul A. Richer |
2021-11-02 |
| 11112433 |
Non-contact electrical parameter measurement device with clamp jaw assembly |
Jeffrey Worones, Chris Corrigan, Yinzi Liang |
2021-09-07 |
| D891951 |
Self-leveling laser level |
Paul A. Richer |
2020-08-04 |
| D891957 |
Documenting process calibrator |
Matthew Carl-Robert Bannister |
2020-08-04 |