Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10697841 | System for measuring residual stress in optical thin films in both transmission and reflection | — | 2020-06-30 |
| 6466308 | Method for measuring a thermal expansion coefficient of a thin film by using phase shifting interferometry | Cheng-Chung Jaing, Cheng-Chung Lee, Ing-Jer Ho | 2002-10-15 |