Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174113 | Photoresist characteristics analysis method and characteristics analysis device | Akira Watanabe, Takeji Ueda | 2024-12-24 |
| 12072285 | Measuring jig, and calibration method and terahertz wave measuring method using same | Akira Watanabe, Takeji Ueda | 2024-08-27 |
| 11680896 | Electromagnetic signal analysis apparatus and electromagnetic signal analysis program | Akira Watanabe, Takeji Ueda | 2023-06-20 |
| 11181474 | Terahertz wave signal analysis device, terahertz wave signal analysis method, and terahertz wave signal analysis program | Akira Watanabe, Takeji Ueda | 2021-11-23 |
| 10352849 | Terahertz time domain spectroscopic apparatus | Akira Watanabe, Takeji Ueda | 2019-07-16 |
| 10295461 | Terahertz time domain spectroscopy device | Akira Watanabe, Takeji Ueda | 2019-05-21 |
| 7689369 | Problem diagnosis method and problem repair method for laser device | Akira Watanabe, Hiroshi Tsugita, Tetsumi Sumiyoshi, Hitoshi Sekita | 2010-03-30 |
| 7457030 | Wavelength conversion device | Akira Watanabe | 2008-11-25 |