Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423772 | Systems and methods for hybrid enhancement of scanning electron microscope images | — | 2025-09-23 |
| 12254645 | Shape invariant method for accurate fiducial finding | Mark Biedrzycki | 2025-03-18 |
| 11947270 | Metrology of semiconductor devices in electron micrographs using fast marching level sets | — | 2024-04-02 |
| 11494914 | Smart metrology on microscope images | — | 2022-11-08 |
| 10748290 | Smart metrology on microscope images | — | 2020-08-18 |
| 9147104 | Systems and methods for processing low contrast images | Thomas J. Lamkin | 2015-09-29 |