FV

Frantisek Vaske

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #2,787,608 of 4,157,543Top 70%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10629409 Specimen preparation and inspection in a dual-beam charged particle microscope Tomas Vystavel, Daniel Bosák 2020-04-21