DH

Damon Heer

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #3,134,349 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8884247 System and method for ex situ analysis of a substrate Thomas G. Miller, Jason Arjavac, Michael Strauss, Gerardus N. A. Van Veen 2014-11-11