AV

Adrianus Johannes Verkleij

FE Fei: 1 patents #375 of 681Top 60%
📍 Nieuwegein, NL: #59 of 142 inventorsTop 45%
Overall (All Time): #3,280,549 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7671333 Apparatus for observing a sample with a particle beam and an optical microscope Alexandra Valerievna Agronskaja, Hans Casper Gerritsen, Abraham Johannes Koster 2010-03-02