Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11320645 | Inner surface image inspection apparatus | — | 2022-05-03 |
| 7856866 | Method of operating an atomic force microscope in tapping mode with a reduced impact force | Andrew James Dick, Balakumar Balachandran, Hiroshi Yabuno, Keiichi Hayashi, Masaharu Kuroda +1 more | 2010-12-28 |