Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11481630 | Machining condition adjustment device and machining condition adjustment system | Wataru Shiraishi | 2022-10-25 |
| 11280679 | Temperature measuring device | Susumu Maekawa | 2022-03-22 |
| 11249454 | Thermal displacement correction device considering sensor failure | Susumu Maekawa | 2022-02-15 |
| 11209794 | Abnormality determination apparatus, non-transitory computer readable medium encoded with a program, abnormality determination system and abnormality determination method | Susumu Maekawa | 2021-12-28 |
| 11150626 | Reference temperature setting device, reference temperature setting method, and reference temperature setting program | Susumu Maekawa | 2021-10-19 |
| 10890892 | Abnormality determination apparatus, non-transitory computer readable medium encoded with a program, abnormality determination system and abnormality determination method | Susumu Maekawa | 2021-01-12 |