| 4703436 |
Wafer level integration technique |
— |
1987-10-27 |
| 4567580 |
Redundancy roll call technique |
— |
1986-01-28 |
| 4496852 |
Low power clock generator |
Eugene M. Blaser, Paul W. Chung |
1985-01-29 |
| 4495603 |
Test system for segmented memory |
— |
1985-01-22 |
| 4493060 |
Serial-parallel-serial charged coupled device memory and a method of transferring charge therein |
— |
1985-01-08 |
| 4480199 |
Identification of repaired integrated circuits |
Robert J. Strain |
1984-10-30 |
| 4476546 |
Programmable address buffer for partial products |
— |
1984-10-09 |
| 4462846 |
Semiconductor structure for recessed isolation oxide |
— |
1984-07-31 |
| 4409676 |
Method and means for diagnostic testing of CCD memories |
— |
1983-10-11 |
| 4384353 |
Method and means for internal error check in a digital memory |
— |
1983-05-17 |
| 4354257 |
Sense amplifier for CCD memory |
Kalyanasundaram Venkateswaran |
1982-10-12 |
| 4275387 |
Charge-coupled device serial analog-to-digital converter and associated conversion method |
— |
1981-06-23 |
| 4272308 |
Method of forming recessed isolation oxide layers |
— |
1981-06-09 |
