Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714279 | Vehicle display device | Naohisa Murata, Yuta Miyake | 2023-08-01 |
| 9279848 | Test apparatus | Isao Baba | 2016-03-08 |
| 8783207 | Meter pointer device | Atsushi Yoshimura | 2014-07-22 |
| 8506102 | Indicator and display apparatus | Atsushi Yoshimura | 2013-08-13 |
| 8248587 | Testing method of semiconductor laser and laser testing device | Isao Baba, Makoto Sugiyama | 2012-08-21 |
| 8120506 | Display unit having a dial and a central display | — | 2012-02-21 |
| 7921343 | Testing system, testing system control method, and test apparatus | — | 2011-04-05 |
| 7907650 | Laser module, control method of the same, control data of the same, and control data generation method | Isao Baba | 2011-03-15 |
| 7757136 | Testing system, testing system control method, and test apparatus | — | 2010-07-13 |
| 7644326 | Testing system and testing system control method | — | 2010-01-05 |
| 7614801 | Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module | Hidemitsu Sugawara | 2009-11-10 |
| 7411178 | Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperatures | — | 2008-08-12 |
| 7316510 | Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module | Hidemitsu Sugawara | 2008-01-08 |
| 6822984 | Device for and method of testing semiconductor laser module | Isao Baba | 2004-11-23 |
| 6807199 | Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof | Isao Baba | 2004-10-19 |
| 6748746 | Device and method for controlling temperature of semiconductor module | — | 2004-06-15 |