| 11714279 |
Vehicle display device |
Naohisa Murata, Yuta Miyake |
2023-08-01 |
| 9279848 |
Test apparatus |
Isao Baba |
2016-03-08 |
| 8783207 |
Meter pointer device |
Atsushi Yoshimura |
2014-07-22 |
| 8506102 |
Indicator and display apparatus |
Atsushi Yoshimura |
2013-08-13 |
| 8248587 |
Testing method of semiconductor laser and laser testing device |
Isao Baba, Makoto Sugiyama |
2012-08-21 |
| 8120506 |
Display unit having a dial and a central display |
— |
2012-02-21 |
| 7921343 |
Testing system, testing system control method, and test apparatus |
— |
2011-04-05 |
| 7907650 |
Laser module, control method of the same, control data of the same, and control data generation method |
Isao Baba |
2011-03-15 |
| 7757136 |
Testing system, testing system control method, and test apparatus |
— |
2010-07-13 |
| 7644326 |
Testing system and testing system control method |
— |
2010-01-05 |
| 7614801 |
Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module |
Hidemitsu Sugawara |
2009-11-10 |
| 7411178 |
Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperatures |
— |
2008-08-12 |
| 7316510 |
Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module |
Hidemitsu Sugawara |
2008-01-08 |
| 6822984 |
Device for and method of testing semiconductor laser module |
Isao Baba |
2004-11-23 |
| 6807199 |
Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof |
Isao Baba |
2004-10-19 |
| 6748746 |
Device and method for controlling temperature of semiconductor module |
— |
2004-06-15 |