YC

Y. C. Chui

ET Etron Technology: 1 patents #75 of 145Top 55%
Overall (All Time): #3,688,104 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5771243 Method of identifying redundant test patterns Robert G. H. Lee 1998-06-23