FF

Fatima Frakso

ED Essilor International (Compagnie Generale D'Optique): 1 patents #310 of 693Top 45%
Overall (All Time): #3,682,566 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5745240 Method and device for in situ stress measurement within a thin film upon its deposition on a substrate Richard Bosmans, Luc Nouvelot 1998-04-28