Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10908207 | Systems and methods for conforming device testers to integrated circuit device with pressure relief valve | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2021-02-02 |
| 10126356 | Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plate | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2018-11-13 |
| 9804223 | Systems and methods for conforming test tooling to integrated circuit device with heater socket | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2017-10-31 |
| 9557373 | Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2017-01-31 |
| 9494642 | Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanisms | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2016-11-15 |
| 9383406 | Systems and methods for conforming device testers to integrated circuit device with pressure relief valve | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2016-07-05 |
| 9279852 | Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushings | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2016-03-08 |
| 9229049 | Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2016-01-05 |
| 9007080 | Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2015-04-14 |
| 8981802 | Systems and methods for conforming device testers to integrated circuit device profiles | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2015-03-17 |
| 8653842 | Systems and methods for thermal control of integrated circuits during testing | Nasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek | 2014-02-18 |
| 8508245 | Thermal control unit used to maintain the temperature of IC devices under test | Nasser Barabi, Joven R. Tienzo, Chee Wah Ho | 2013-08-13 |
| 7663388 | Active thermal control unit for maintaining the set point temperature of a DUT | Nasser Barabi, Joven R. Tienzo, Chee Wah Ho | 2010-02-16 |