Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4796999 | Device for automatically determining the deviation between the structures of a pattern and those of an object compared therewith | Manfred Kartzow | 1989-01-10 |
| 4758731 | Method and arrangement for aligning, examining and/or measuring two-dimensional objects | — | 1988-07-19 |
| 4738033 | Rapid change holder for probe pins | Wolfgang Ferber | 1988-04-19 |
| 4455755 | Apparatus for sensing test values at test samples | Rainer Fritsche, Hans-Dieter Jacoby | 1984-06-26 |
| 4364180 | Instrumentation for sensing the test values at test samples | Jorg Willhelm, Hans-Dieter Jacoby, Dieter Prinz | 1982-12-21 |
| 4308666 | Linear micrometer | Herbert Hahn, Hans-Dieter Jacoby, Richard H. Jung | 1982-01-05 |
| 4188119 | Two-coordinate length measuring device for microscopic instruments | Karl-Wilhelm Schenck, Gunthard Nissel | 1980-02-12 |