Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8282845 | Etching with improved control of critical feature dimensions at the bottom of thick layers | Arnoldus Den Dekker, Ronald Koster, Robertus Theodorus Fransiscus Van Schaijk | 2012-10-09 |