Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8331647 | Method of determining defect size of pattern used to evaluate defect detection sensitivity and method of creating sensitivity table | Noriaki Musashi | 2012-12-11 |
| 4356982 | Apparatus and process for producing slurry | Yasuyuki Nakabayashi, Kihei Katsuta | 1982-11-02 |
| 4262850 | Apparatus and process for producing slurry | Yasuyuki Nakabayashi, Kihei Katsuta | 1981-04-21 |